New D1 GIWAXS procedure

Detlef Smilgies

mount sample

• go into hutch and move CCD camera back
• mount new sample
  
• put Idet ion chamber in
• interlock hutch and open main shutter

align sample

• new data file > new
• put in new sample name
  
• OR hit return to continue with old name
• find sample height > rock
• reflectivity curve > xr
• determine absolute value of incident angle roughly from substrate critical angle on print-out
  
• calibrate samth > mv samth [critical angle position]; set samth [critical angle value]
  
• make more detailed reflectivity scans, if desired
• for finetuning xrfine scan parameters, use > set_xrfine

take images

• enable CCD macros > ccdon
  
• go into hutch, remove Idet ion chamber, and move CCD against clamp
  
• open main shutter, enable and open garage door on controller
  
• test image to verify correct beamstop position  > corr 1 .1
• if CCD is overloaded, fix problem (if you think you can) or call Detlef !!!
  
• take images at various samth and samx positions using corr and dark
• usage > corr [mode] [exposure]
• without dezingering: mode=1
•  with dezingering for exposures > 5 sec: mode = 2
• image averaging:  2 <= mode <= 10
  
• usage > dark [exposure]
• dark images only need to be taken once a day; create new dark image for new exposure time
• view list of previous dark images > ls dark
  
• take image of direct beam > beam
• disable CCD macros > ccdoff

additional macros (expert use only)

• open CCD shutter manually (make sure CCD is protected by closing the garage door !!!) > shopen
• close CCD shutter manually > shclose
  
• determine electronic offset of Idet for high-quality reflectivity scans > offset
• the offset count rate is saved in the log file as tseries scan
  

• move beamstop in > bsin
• move beamstop out > bsout
• move blade in for reflectivity > blade
• move attenuator in for beam image > attin