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Medjidzade, V.

Paper Title Page
PST01 Implementation and Operation of Electron Cloud Diagnostics for CesrTA 83
 
  • Y. Li, X. Liu, V. Medjidzade, J. Conway, M. Palmer
    Cornell University - CLASSE
 
  The vacuum system of Cornell Electron Storage Ring (CESR) was successfully reconfigured to support CesrTA physics programs, including electron cloud (EC) build-up and suppression studies. One of key features of the reconfigured CESR vacuum system is the flexibility for exchange of various vacuum chambers with minimized impact to the accelerator operations. This is achieved by creation of three short gate-valve isolated vacuum sections. Over the last three years, many vacuum chambers with various EC diagnostics (such as RFAs, shielded pickups, etc) were rotated through these short experimental sections. With these instrumented test chambers, EC build-up was studied in many magnetic field types, including dipoles, quadrupoles, wigglers and field-free drifts. EC suppression techniques by coating (TiN, NEG and a-C), surface textures (grooves) and clearing electrode are incorporated in these test chambers to evaluate their effectiveness. We present the implementation and operations of EC diagnostics.  
PST12 In Situ SEY Measurements at CesrTA 140
 
  • J. Kim, J. Conway, S. Greenwald, Y. Li, T. Moore, M. Palmer, V. Medjidzade, D. Asner, C. Strohman
    Cornell University - CLASSE
 
  Measuring secondary electron yields (SEYs) on technical surfaces in accelerator vacuum systems provides essential information for many accelerator R&D projects, such as the ILC Damping Rings, regarding to electron cloud growth and suppression. As a part of CesrTA research program, we developed and deployed SEY in-situ measurement systems. Two such SEY systems were installed to expose samples with direct and scattered synchrotron radiation (SR), and the SEYs of the samples were measured as a function of SR dosages. In this poster, we describe the in-situ SEY measurement systems and the initial results on bare aluminum and TiN-coated aluminum samples.