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PST12 In Situ SEY Measurements at CesrTA electron, vacuum, radiation, controls 140
 
  • J. Kim, J. Conway, S. Greenwald, Y. Li, T. Moore, M. Palmer, V. Medjidzade, D. Asner, C. Strohman
    Cornell University - CLASSE
  Measuring secondary electron yields (SEYs) on technical surfaces in accelerator vacuum systems provides essential information for many accelerator R&D projects, such as the ILC Damping Rings, regarding to electron cloud growth and suppression. As a part of CesrTA research program, we developed and deployed SEY in-situ measurement systems. Two such SEY systems were installed to expose samples with direct and scattered synchrotron radiation (SR), and the SEYs of the samples were measured as a function of SR dosages. In this poster, we describe the in-situ SEY measurement systems and the initial results on bare aluminum and TiN-coated aluminum samples.